US PATENT SUBCLASS 702 / FOR 155
.~ Operations performed (364/570)


Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155.~ Operations performed (364/570) {11}
FOR 156  DF  .~.~> Calibration or compensation {3}
FOR 164  DF  .~.~> Filtering (364/572)
FOR 165  DF  .~.~> Linearization (364/573)
FOR 166  DF  .~.~> Noise reduction (364/574)
FOR 167  DF  .~.~> Averaging (364/575)
FOR 168  DF  .~.~> Fourier analysis (364/576)
FOR 169  DF  .~.~> Interpolation/extrapolation (364/577)
FOR 170  DF  .~.~> With control of testing or measuring apparatus (364/579)
FOR 171  DF  .~.~> Programmed testing conditions (364/580)
FOR 172  DF  .~.~> Weighting (364/581)
FOR 173  DF  .~.~> Normalization (364/582)


DEFINITION

Classification: 702/FOR.155

Operations performed:

Foreign art collections where there is significant recitation of the particular manner in which the measuring, testing, or monitoring is accomplished.