US PATENT SUBCLASS 702 / FOR 157
.~.~.~ Having mathematical operation on initial measurement data (364/571.02)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 156  DF  .~.~ Calibration or compensation {3}
FOR 157.~.~.~ Having mathematical operation on initial measurement data (364/571.02) {4}
FOR 158  DF  .~.~.~.~> Including environmental factors (e.g., temperature) (364/571.03)
FOR 159  DF  .~.~.~.~> Including predetermined stored data (364/571.04)
FOR 160  DF  .~.~.~.~> Using difference involving initial measurement data (364/571.05)
FOR 161  DF  .~.~.~.~> Using analog calculating elements (364/571.06)

DEFINITION

Classification: 702/FOR.157

Having mathematical operation on initial measurement data:

Foreign art collections in which the true measurement data is derived from a mathematical function on the initial measurement data.