US PATENT SUBCLASS 702 / FOR 156
.~.~ Calibration or compensation

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 156.~.~ Calibration or compensation {3}
FOR 157  DF  .~.~.~> Having mathematical operation on initial measurement data (364/571.02) {4}
FOR 162  DF  .~.~.~> By table look-up (364/571.07)
FOR 163  DF  .~.~.~> Using operator provided data (364/571.08)

DEFINITION

Classification: 702/FOR.156

Calibration or compensation:

Foreign art collections for determining the accuracy or operating characteristics of a measuring device or producing true measurement data from initial measurement data.