US PATENT SUBCLASS 702 / FOR 158
.~.~.~.~ Including environmental factors (e.g., temperature) (364/571.03)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 156  DF  .~.~ Calibration or compensation {3}
FOR 157  DF  .~.~.~ Having mathematical operation on initial measurement data (364/571.02) {4}
FOR 158.~.~.~.~ Including environmental factors (e.g., temperature) (364/571.03)

DEFINITION

Classification: 702/FOR.158

Including environmental factors (e.g., temperature):

Foreign art collections where ambient data is utilized to compensate initial data.