US PATENT SUBCLASS 378 / 73
.~.~.~ Crystalography


Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
70  DF  .~ Diffraction, reflection, or scattering analysis {3}
71  DF  .~.~ Diffractometry {3}
73.~.~.~ Crystalography {5}
74  DF  .~.~.~.~> Topography
75  DF  .~.~.~.~> Powder technique
76  DF  .~.~.~.~> Back reflection
77  DF  .~.~.~.~> Precession
78  DF  .~.~.~.~> Piezoelectric crystal


DEFINITION

Classification: 378/73

Crystallography:

(under subclass 71) Subject matter wherein the analyte is a crystal.