(under subclass 1) Subject matter including the measurement or sensing of X-rays, the direction of which have been modified by interaction with an object under examination.
(1) Note. Although not specifically included within each of the following definitions, diffraction, reflection, or scattering systems usually include, (a) source of X-rays or gamma rays, (b) a diffracting, reflecting, or scattering object, (c) an object holder or positioning means, and (d) a detector of diffracted, reflected, or scattered X-rays.
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209, Classifying, Separating, and Assorting Solids, appropriate subclasses, especially
