US PATENT SUBCLASS 378 / 76
.~.~.~.~ Back reflection

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
70  DF  .~ Diffraction, reflection, or scattering analysis {3}
71  DF  .~.~ Diffractometry {3}
73  DF  .~.~.~ Crystalography {5}
76.~.~.~.~ Back reflection

DEFINITION

Classification: 378/76

Back reflection:

(under subclass 73) Subject matter in which the crystal is analyzed by the back reflection technique.

(1) Note. For a more detailed treatment of the back reflection technique, see Applied X-rays, by George L. Clark, McGraw Hill Book Co., 1955.