US PATENT SUBCLASS 378 / 74
.~.~.~.~ Topography

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
70  DF  .~ Diffraction, reflection, or scattering analysis {3}
71  DF  .~.~ Diffractometry {3}
73  DF  .~.~.~ Crystalography {5}
74.~.~.~.~ Topography

DEFINITION

Classification: 378/74

Topography:

(under subclass 73) Subject matter including measuring surface features of a crystal by analyzing the manner in which X-rays are differentially diffracted by different areas of the surface of the crystal.