US PATENT SUBCLASS 378 / 77
.~.~.~.~ Precession
Current as of:
June, 1999
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378 /
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X-RAY OR GAMMA RAY SYSTEMS OR DEVICES
1
DF
SPECIFIC APPLICATION
{14}
70
DF
.~ Diffraction, reflection, or scattering analysis {3}
71
DF
.~.~ Diffractometry {3}
73
DF
.~.~.~ Crystalography {5}
77
.~.~.~.~ Precession
DEFINITION
Classification: 378/77
Precession:
(under subclass 73) Subject matter in which the crystal is analyzed by the precession technique.
(1) Note. For a more detailed treatment of the precession technique, see Applied X-rays, by George L. Clark, McGraw Hill Book Co., 1955.