US PATENT SUBCLASS 702 / FOR 163
.~.~.~ Using operator provided data (364/571.08)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 156  DF  .~.~ Calibration or compensation {3}
FOR 163.~.~.~ Using operator provided data (364/571.08)

DEFINITION

Classification: 702/FOR.163

Using operator provided data:

Foreign art collections where manually provided data is used in generating or deriving the true measurement data.