US PATENT SUBCLASS 702 / FOR 162
.~.~.~ By table look-up (364/571.07)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 156  DF  .~.~ Calibration or compensation {3}
FOR 162.~.~.~ By table look-up (364/571.07)

DEFINITION

Classification: 702/FOR.162

By table look-up:

Foreign art collections in which the initial measurement data is used in a specified manner to obtain the true measurement data previously stored in a memory.