US PATENT SUBCLASS 702 / 193
.~.~.~.~ By threshold comparison

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
189  DF  .~ Measured signal processing {3}
190  DF  .~.~ Signal extraction or separation (e.g., filtering) {2}
191  DF  .~.~.~ For noise removal or suppression {2}
193.~.~.~.~ By threshold comparison

DEFINITION

Classification: 702/193

By threshold comparison:

(under subclass 191) Subject matter wherein means for eliminating or reducing the distortion signal includes means for comparing the incoming signal with a reference limit set value.

SEE OR SEARCH CLASS

327, Miscellaneous Active Electrical Nonlinear Devices, Circuits, and Systems,

77+, for specific signal discriminating without subsequent control by comparing an input signal to a single fixed reference.