US PATENT SUBCLASS 438 / 698
.~.~.~ Utilizing reflow
Current as of:
June, 1999
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438 /
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SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS
689
DF
CHEMICAL ETCHING
{6}
694
DF
.~ Combined with coating step {5}
697
DF
.~.~ Planarization by etching and coating {2}
698
.~.~.~ Utilizing reflow
DEFINITION
Classification: 438/698
Utilizing reflow:
(under subclass 697) Processes wherein the planarization
method requires decreasing the viscosity of a layer residing on the substrate in order to fluidize the same.