257 / | HD | ACTIVE SOLID-STATE DEVICES (E.G., TRANSISTORS, SOLID-STATE DIODES) |
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49 | | NON-SINGLE CRYSTAL, OR RECRYSTALLIZED, SEMICONDUCTOR MATERIAL FORMS PART OF ACTIVE JUNCTION (INCLUDING FIELD-INDUCED ACTIVE JUNCTION) {9} |
50 | DF | .~> Non-single crystal, or recrystallized, active junction adapted to be electrically shorted (e.g., "anti-fuse" element) |
51 | DF | .~> Non-single crystal, or recrystallized, material forms active junction with single crystal material (e.g., monocrystal to polycrystal pn junction or heterojunction) |
52 | DF | .~> Amorphous semiconductor material {4} |
64 | DF | .~> Non-single crystal, or recrystallized, material with specified crystal structure (e.g., specified crystal size or orientation) |
65 | DF | .~> Non-single crystal, or recrystallized, material containing non-dopant additive, or alloy of semiconductor materials (e.g., GexSi1-x, polycrystalline silicon with dangling bond modifier) |
66 | DF | .~> Field effect device in non-single crystal, or recrystallized, semiconductor material {3} |
73 | DF | .~> Schottky barrier to polycrystalline semiconductor material |
74 | DF | .~> Plural recrystallized semiconductor layers (e.g., "3-dimensional integrated circuit") |
75 | DF | .~> Recrystallized semiconductor material |