US PATENT SUBCLASS 250 / 306
INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


250 /   HD   RADIANT ENERGY

306INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES {6}
307  DF  .~> Methods
308  DF  .~> Including a radioactive source
309  DF  .~> Positive ion probe or microscope type
310  DF  .~> Electron probe type
311  DF  .~> Electron microscope type
440.11  DF  .~> Analyte supports {3}

DEFINITION

Classification: 250/306

(under the class definition) Subject matter wherein the apparatus comprises a source of or means which impels charged particles toward a nongaseous object or material to be studied and both means to support, position or accommodate the object or material relative to the source or a detector, and means to detect such particles that pass near to or through the object or material, or are reflected from or diffracted by said object or material, or secondary radiation emitted from the object or material.

(1) Note. The secondary radiation emitted by the object or material may be X-rays, however, placement here requires examination of the object or material rather than merely bombarding a target to generate X-rays.

SEE OR SEARCH THIS CLASS, SUBCLASS:

336.1+, for this combination with an electric detector where the object is not studied.

399, for X-ray generation with deflection, scanning, spreading or focusing of the beam of electrons or ions bombarding a target.

423+, for ion generators with focusing means not of the beam lens type. SEE OR SEARCH CLASS

73, Measuring and Testing,

861.05, 861.07, and 861.09 for the measurement of the volume or rate of flow of charged particles.

378, X-Ray or Gamma Ray Systems or Devices,

138, for X-ray tube with focusing means not of the beam lens type.