US PATENT SUBCLASS 250 / 311
.~ Electron microscope type

Current as of: June, 1999
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250 /   HD   RADIANT ENERGY

306  DF  INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES {6}
311.~ Electron microscope type

DEFINITION

Classification: 250/311

(under subclass 306) Subject matter wherein electrons are impelled toward the object or material and the particles detected are electrons which have passed near or through the object or material without substantial deflection.

SEE OR SEARCH THIS CLASS, SUBCLASS:

440+, for object supports with or without a source.