US PATENT SUBCLASS 250 / 309
.~ Positive ion probe or microscope type

Current as of: June, 1999
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250 /   HD   RADIANT ENERGY

306  DF  INSPECTION OF SOLIDS OR LIQUIDS BY CHARGED PARTICLES {6}
309.~ Positive ion probe or microscope type

DEFINITION

Classification: 250/309

(under subclass 306) Subject matter wherein the charged particles are positively charged.