US PATENT SUBCLASS 73 / 766
.~.~.~ Temperature

Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

760  DF  SPECIMEN STRESS OR STRAIN, OR TESTING BY STRESS OR STRAIN APPLICATION {12}
763  DF  .~ Specified electrical sensor or system {6}
765  DF  .~.~ Compensation (e.g., linearization) {1}
766.~.~.~ Temperature

DEFINITION

Classification: 73/766

Temperature:

(under subclass 765) Subject matter wherein the compensating means operates to eliminate thermally caused measurement errors.