US PATENT SUBCLASS 73 / 765
.~.~ Compensation (e.g., linearization)

Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

760  DF  SPECIMEN STRESS OR STRAIN, OR TESTING BY STRESS OR STRAIN APPLICATION {12}
763  DF  .~ Specified electrical sensor or system {6}
765.~.~ Compensation (e.g., linearization) {1}
766  DF  .~.~.~> Temperature

DEFINITION

Classification: 73/765

Compensation (e.g., linearization):

(under subclass 763) Subject matter including means to provide a constant relationship between stress and strain or to eliminate measurement errors due to changes in the test environment.

(1) Note. Linearizing circuits are included herein as nonlinearity compensating circuits.