73 / | HD | MEASURING AND TESTING |
|
760 | DF | SPECIMEN STRESS OR STRAIN, OR TESTING BY STRESS OR STRAIN APPLICATION {12} |
763 | | .~ Specified electrical sensor or system {6} |
764 | DF | .~.~> Having level attainment counter |
765 | DF | .~.~> Compensation (e.g., linearization) {1} |
767 | DF | .~.~> Plural sensors at single location (e.g., diverse orientation, plural level) |
768 | DF | .~.~> Sensor embedded in specimen |
769 | DF | .~.~> Coupling circuit for specific additional purpose (e.g., noise suppression) or having specified structure {4} |
774 | DF | .~.~> Specified sensor structure {5} |