US PATENT SUBCLASS 73 / 764
.~.~ Having level attainment counter

Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

760  DF  SPECIMEN STRESS OR STRAIN, OR TESTING BY STRESS OR STRAIN APPLICATION {12}
763  DF  .~ Specified electrical sensor or system {6}
764.~.~ Having level attainment counter

DEFINITION

Classification: 73/764

Having level attainment counter:

(under subclass 763) Subject matter including means to determine the number of times one or more predetermined levels of stress or strain are reached or exceeded.

SEE OR SEARCH THIS CLASS, SUBCLASS:

769+, for other counters controlled by stress or strain responsive elements.

787, for time-related (e.g., time integral) stress or strain parameters, in general.