US PATENT SUBCLASS 702 / FOR 171
.~.~ Programmed testing conditions (364/580)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 171.~.~ Programmed testing conditions (364/580)

DEFINITION

Classification: 702/FOR.171

Programmed testing conditions:

Foreign art collections wherein the testing, measuring, or monitoring is done under the control of a sequence of instructions.