US PATENT SUBCLASS 702 / FOR 170
.~.~ With control of testing or measuring apparatus (364/579)

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 170.~.~ With control of testing or measuring apparatus (364/579)

DEFINITION

Classification: 702/FOR.170

With control of testing or measuring apparatus:

Foreign art collections including subject matter with control of the testing, measuring, or monitoring apparatus.