US PATENT SUBCLASS 702 / FOR 165
.~.~ Linearization (364/573)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 165.~.~ Linearization (364/573)

DEFINITION

Classification: 702/FOR.165

Linearization:

Foreign art collections wherein the operation performed is establishing a first degree relationship between two variables.