US PATENT SUBCLASS 702 / FOR 153
.~.~.~ Basis weight (364/568)

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 141  DF  .~ For basic measurements (364/556) {8}
FOR 152  DF  .~.~ Weight (364/567) {1}
FOR 153.~.~.~ Basis weight (364/568)

DEFINITION

Classification: 702/FOR.153

Basis weight:

Foreign art collections for evaluating the weight per unit area.