US PATENT SUBCLASS 702 / FOR 141
.~ For basic measurements (364/556)


Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use



702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 141.~ For basic measurements (364/556) {8}
FOR 142  DF  .~.~> Temperature (364/557)
FOR 143  DF  .~.~> Pressure or density (364/558)
FOR 144  DF  .~.~> Orientation (364/559)
FOR 145  DF  .~.~> Dimension (364/560) {2}
FOR 150  DF  .~.~> Rate of change of dimension (e.g., speed) (364/565)
FOR 151  DF  .~.~> Acceleration and further derivatives (364/566)
FOR 152  DF  .~.~> Weight (364/567) {1}
FOR 154  DF  .~.~> Time or time intervals (364/569)


DEFINITION

Classification: 702/FOR.141

For basic measurements:

Foreign art collections including subject matter for fundamental measurements.