US PATENT SUBCLASS 702 / FOR 149
.~.~.~ Area or volume (364/564)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 141  DF  .~ For basic measurements (364/556) {8}
FOR 145  DF  .~.~ Dimension (364/560) {2}
FOR 149.~.~.~ Area or volume (364/564)

DEFINITION

Classification: 702/FOR.149

Area or volume:

Foreign art collections wherein the linear measurement is the product of a plurality of dimensions.