US PATENT SUBCLASS 702 / FOR 144
.~.~ Orientation (364/559)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 141  DF  .~ For basic measurements (364/556) {8}
FOR 144.~.~ Orientation (364/559)

DEFINITION

Classification: 702/FOR.144

Orientation:

Foreign art collections including subject matter for measuring the spatial relationship of an object with respect to a reference axis.