US PATENT SUBCLASS 702 / FOR 117
.~.~.~ Spectrum analysis (composition) (364/498)


Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

*  DD  APPLICATIONS (364/400) {2}
FOR 115  DF  .~ Chemical and engineering sciences (364/496) {3}
FOR 116  DF  .~.~ Chemical analysis (364/497) {2}
FOR 117.~.~.~ Spectrum analysis (composition) (364/498)


DEFINITION

Classification: 702/FOR.117

Spectrum analysis (composition):

Foreign art collections wherein the chemical analysis is the analysis of substances or bodies through study of their spectra.