US PATENT SUBCLASS 702 / FOR 116
.~.~ Chemical analysis (364/497)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

*  DD  APPLICATIONS (364/400) {2}
FOR 115  DF  .~ Chemical and engineering sciences (364/496) {3}
FOR 116.~.~ Chemical analysis (364/497) {2}
FOR 117  DF  .~.~.~> Spectrum analysis (composition) (364/498)
FOR 118  DF  .~.~.~> Chemical property (364/499)

DEFINITION

Classification: 702/FOR.116

Chemical analysis:

Foreign art collections wherein the area is the chemical analysis of a product or substance or element.