US PATENT SUBCLASS 702 / FOR 108
.~.~.~.~ Frequency spectrum (364/485)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

*  DD  APPLICATIONS (364/400) {1}
FOR 103  DF  .~ Electrical/electronic engineering (364/480) {1}
FOR 104  DF  .~.~ Measuring or testing (364/481) {5}
FOR 107  DF  .~.~.~ Frequency (364/484) {1}
FOR 108.~.~.~.~ Frequency spectrum (364/485)

DEFINITION

Classification: 702/FOR.108

Frequency spectrum:

Foreign art collections wherein the waveform is complex and the frequency spectrum is determined or analyzed.