US PATENT SUBCLASS 702 / FOR 104
.~.~ Measuring or testing (364/481)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

*  DD  APPLICATIONS (364/400) {1}
FOR 103  DF  .~ Electrical/electronic engineering (364/480) {1}
FOR 104.~.~ Measuring or testing (364/481) {5}
FOR 105  DF  .~.~.~> Impedance (364/482)
FOR 106  DF  .~.~.~> Voltage, current, or power (364/483)
FOR 107  DF  .~.~.~> Frequency (364/484) {1}
FOR 109  DF  .~.~.~> Pulse (364/486)
FOR 110  DF  .~.~.~> Waveform (364/487)

DEFINITION

Classification: 702/FOR.104

Measuring and testing:

Foreign art collections wherein the area of electrical/electronic engineering is measuring or testing of for an electrical circuit, component, parameter, or value.