US PATENT SUBCLASS 702 / FOR 107
.~.~.~ Frequency (364/484)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

*  DD  APPLICATIONS (364/400) {1}
FOR 103  DF  .~ Electrical/electronic engineering (364/480) {1}
FOR 104  DF  .~.~ Measuring or testing (364/481) {5}
FOR 107.~.~.~ Frequency (364/484) {1}
FOR 108  DF  .~.~.~.~> Frequency spectrum (364/485)

DEFINITION

Classification: 702/FOR.107

Frequency:

Foreign art collections wherein the area includes the measuring or testing of at least one frequency of a waveform.