US PATENT SUBCLASS 702 / 59
.~.~.~ Fault location
Current as of:
June, 1999
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702 /
HD
DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING
1
DF
MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT
{6}
57
DF
.~ Electrical signal parameter measurement system {6}
58
DF
.~.~ For electrical fault detection {1}
59
.~.~.~ Fault location
DEFINITION
Classification: 702/59
Fault location:
(under subclass 58) Subject matter having means to identify an address or orientation of the defect or disturbance.
SEE OR SEARCH THIS CLASS, SUBCLASS:
185, for cause or fault identification in a performance or efficiency evaluation system.
SEE OR SEARCH CLASS
324, Electricity: Measuring and Testing,
512+, for fault location detecting in electric circuits and of electric components.