US PATENT SUBCLASS 702 / 59
.~.~.~ Fault location

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
58  DF  .~.~ For electrical fault detection {1}
59.~.~.~ Fault location

DEFINITION

Classification: 702/59

Fault location:

(under subclass 58) Subject matter having means to identify an address or orientation of the defect or disturbance.

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185, for cause or fault identification in a performance or efficiency evaluation system.

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324, Electricity: Measuring and Testing,

512+, for fault location detecting in electric circuits and of electric components.