US PATENT SUBCLASS 702 / 42
.~.~.~ Stress or strain measurement

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
33  DF  .~ Mechanical measurement system {6}
41  DF  .~.~ Force or torque measurement {2}
42.~.~.~ Stress or strain measurement {1}
43  DF  .~.~.~.~> Torsional, shear, tensile, or compression

DEFINITION

Classification: 702/42

Stress or strain measurement:

(under subclass 41) Subject matter wherein the strength or energy causes or tends to cause deformation of the body.

SEE OR SEARCH CLASS

73, Measuring and Testing, 760+ for specimen stress or strain, or testing by stress or strain application.

356, Optics: Measuring or Testing,

32+, for material strain analysis.