US PATENT SUBCLASS 702 / 26
.~.~.~ By particle count

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
22  DF  .~ Chemical analysis {6}
23  DF  .~.~ Quantitative determination (e.g., mass, concentration, density) {3}
26.~.~.~ By particle count

DEFINITION

Classification: 702/26

By particle count:

(under subclass 23) Subject matter wherein the amount or proportion of the component is determined by totalizing quantity of particles in the component.

SEE OR SEARCH CLASS

377, Electrical Pulse Counters, Pulse Dividers, or Shift Registers: Circuits And Systems,

1+, for application, particularly subclasses 10+ for field of

view contains plural entities or entities scanned plural times, and subclasses 19+ for measuring or testing.