US PATENT SUBCLASS 438 / FOR 155
.~.~ Of semiconductor on insulating substrate (437/21)


Current as of: June, 1999
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438 /   HD   SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS

FOR 149  DF  INCLUDING FORMING A SEMICONDUCTOR JUNCTION (437/15) {7}
FOR 150  DF  .~ Using energy beam to introduce dopant or modify dopant distribution (437/ 16) {5}
FOR 155.~.~ Of semiconductor on insulating substrate (437/21) {14}
FOR 156  DF  .~.~.~> Of semiconductor compound (437/22) {1}
FOR 158  DF  .~.~.~> Providing nondopant ion including proton (437/24)
FOR 159  DF  .~.~.~> Providing auxiliary heating (437/25)
FOR 160  DF  .~.~.~> Forming buried region (437/26)
FOR 161  DF  .~.~.~> Including multiple implantations of same region (437/27) {4}
FOR 169  DF  .~.~.~> Using oblique beam (437/35)
FOR 170  DF  .~.~.~> Using shadow mask (437/36)
FOR 171  DF  .~.~.~> Having projected range less than thickness of dielectrics on substrate (437/37)
FOR 172  DF  .~.~.~> Into shaped or grooved semiconductor substrate (437/38)
FOR 173  DF  .~.~.~> Involving Schottky contact formation (437/39) {12}
FOR 206  DF  .~.~.~> Into polycrystalline or polyamorphous regions (437/46)
FOR 207  DF  .~.~.~> Integrating active with passive devices (437/47)
FOR 208  DF  .~.~.~> Forming plural active devices in grid/array, e.g., RAMS/ROMS, etc. (437/48) {1}
FOR 210  DF  .~.~.~> Forming electrodes in laterally spaced relationships (437/50)


DEFINITION

Classification: 438/FOR.155

Of semiconductor on insulating substrate:

Foreign art collection for a process wherein the substrate is composed of a material highly resistant to flow of current, e.g., sapphire, beryllium oxide, spinel, etc.