US PATENT SUBCLASS 438 / 952
.~.~ Utilizing antireflective layer
Current as of:
June, 1999
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438 /
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SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS
942
DF
MASKING
{6}
948
DF
.~ Radiation resist {4}
952
.~.~ Utilizing antireflective layer
DEFINITION
Classification: 438/952
Utilizing antireflective layer
Art collection under 948 involving the use of an antireflective layer on the semiconductor substrate.