US PATENT SUBCLASS 438 / 14
WITH MEASURING OR TESTING

Current as of: June, 1999
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438 /   HD   SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS

14WITH MEASURING OR TESTING {3}
15  DF  .~> Packaging (e.g., with mounting, encapsulating, etc.) or treatment of packaged semiconductor
16  DF  .~> Optical characteristic sensed
17  DF  .~> Electrical characteristic sensed {1}

DEFINITION

Classification: 438/14

WITH MEASURING OR TESTING:

(under the class definition) Process having combined therewith a step of measuring or testing a condition of the process or of the device made thereby.

(1) Note. Processes having at least one step proper for the class and combined therewith a step of electrical aging or burn-in are classified herein.

SEE OR SEARCH CLASS

209, Classifying, Separating, and Assorting Solids, especially

571+, for methods of electrical testing thereby sensing a property of an item to facilitate subsequent separation.

250, Radiant Energy,

306+, for inspection of solids or liquids by charged particles, and subclass 371 for invisible radiant energy responsive methods using semiconductor devices.

324, Electricity: Measuring and Testing, for per se electrical measuring, especially 71.5, for determining a nonelectrical property of a semiconductor by measuring an electrical property, subclass 451 for determining a material property using thermoelectric phenomenon, subclasses 500+ for fault detecting in electrical circuits and of electrical components, and subclass 719 for semiconductor materials quality determination using conductivity effects.

374, Thermal Measuring and Testing, especially

57, for thermal testing of susceptibility to thermally induced deterioration, flaw, etc., and subclass 178 for thermal measuring utilizing a barrier layer (e.g., semiconductive junction) sensing element.