438 / | HD | SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS |
5 | DF | INCLUDING CONTROL RESPONSIVE TO SENSED CONDITION {3} |
10 | .~ Electrical characteristic sensed {3} | |
11 | DF | .~.~> Utilizing integral test element |
12 | DF | .~.~> And removal of defect |
13 | DF | .~.~> Altering electrical property by material removal |