| 438 / | HD | SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS |
| 5 | DF | INCLUDING CONTROL RESPONSIVE TO SENSED CONDITION {3} |
| 10 | ![]() | .~ Electrical characteristic sensed {3} |
| 11 | DF | .~.~> Utilizing integral test element |
| 12 | DF | .~.~> And removal of defect |
| 13 | DF | .~.~> Altering electrical property by material removal |