US PATENT SUBCLASS 382 / 190
.~ Feature extraction

Current as of: June, 1999
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382 /   HD   IMAGE ANALYSIS

181  DF  PATTERN RECOGNITION {8}
190.~ Feature extraction {5}
191  DF  .~.~> Multispectral features (e.g., frequency, phase)
192  DF  .~.~> Feature counting {2}
195  DF  .~.~> Local or regional features {7}
206  DF  .~.~> Global features (e.g., measurements on image as a whole, such as area, projections, etc.)
207  DF  .~.~> Waveform analysis {1}

DEFINITION

Classification: 382/190

Feature extraction:

(under subclass 181) Subject matter which includes the process of selecting and measuring pieces of information, such as size, shape, texture, or position, to be used in recognizing a pattern*, structure, or object.

(1) Note. For the purpose of this subclass, "feature" is a synonym for characteristic measurement, component, descriptor, attribute, pattern* primitive, and any other term of art referring to the information derived from a pattern* and utilized in pattern* recognition*.

(2) Note. The aim of feature extraction is to reduce the amount of raw pattern* data while finding a set of attributes for which the different classes of pattern*s separate.