US PATENT SUBCLASS 382 / 206
.~.~ Global features (e.g., measurements on image as a whole, such as area, projections, etc.)

Current as of: June, 1999
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382 /   HD   IMAGE ANALYSIS

181  DF  PATTERN RECOGNITION {8}
190  DF  .~ Feature extraction {5}
206.~.~ Global features (e.g., measurements on image as a whole, such as area, projections, etc.)

DEFINITION

Classification: 382/206

Global features (e.g., measurements on image as a whole, such as area, projections, etc.):

(under subclass 190) Subject matter wherein the features extracted for recognition purposes are not the component parts of what is essentially a more complex pattern*, but rather are measurements characterizing the entire pattern* as a single entity.