US PATENT SUBCLASS 216 / 94
.~ Etching using radiation (e.g., laser, electron-beam, ion-beam, etc.)
Current as of:
June, 1999
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ETCHING A SUBSTRATE: PROCESSES
83
DF
NONGASEOUS PHASE ETCHING OF SUBSTRATE
{9}
94
.~ Etching using radiation (e.g., laser, electron-beam, ion-beam, etc.)
DEFINITION
Classification: 216/94
Etching using radiation (e.g., laser, electron-beam, ion-beam, etc.):
(under subclass 83) Process wherein radiation is used separately or simultaneously during etching.