US PATENT SUBCLASS 73 / 777
.~.~.~ Semiconductor

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


73 /   HD   MEASURING AND TESTING

760  DF  SPECIMEN STRESS OR STRAIN, OR TESTING BY STRESS OR STRAIN APPLICATION {12}
763  DF  .~ Specified electrical sensor or system {6}
774  DF  .~.~ Specified sensor structure {5}
777.~.~.~ Semiconductor

DEFINITION

Classification: 73/777

Semiconductor:

(under subclass 774) Subject matter wherein the sensor is composed of material having conductivity intermediate that of conductors and insulators.

SEE OR SEARCH CLASS

257, Active Solid-State Devices (e.g., Transistors, Solid-State Diodes),

414+, especially subclasses 417+ for stress/strain sensors.

438, Semiconductor Device Manufacturing: Process,

50+, for methods of making semiconductor electrical devices which are sensors of physical deformation.