US PATENT SUBCLASS 73 / 621
.~.~.~.~.~ Having compound scan

Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

570  DF  VIBRATION {10}
584  DF  .~ By mechanical waves {13}
596  DF  .~.~ Beamed {10}
618  DF  .~.~.~ Measuring or testing system having scanning means {2}
620  DF  .~.~.~.~ By reflected wave {4}
621.~.~.~.~.~ Having compound scan

DEFINITION

Classification: 73/621

Having compound scan:

(under subclass 620) Subject matter wherein the scan comprises a compound or combined motion of transmitting and receiving transducer means comprising a movement of the

transducer in transducer supporting means and a movement of the transducer support, at least one of the movements being angular and wherein display means is coordinated with the combined movements of the transducer.