US PATENT SUBCLASS 73 / 620
.~.~.~.~ By reflected wave

Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

570  DF  VIBRATION {10}
584  DF  .~ By mechanical waves {13}
596  DF  .~.~ Beamed {10}
618  DF  .~.~.~ Measuring or testing system having scanning means {2}
620.~.~.~.~ By reflected wave {4}
621  DF  .~.~.~.~.~> Having compound scan
622  DF  .~.~.~.~.~> Of tubing, vessel, or cylindrical object {1}
624  DF  .~.~.~.~.~> Having separate sonic transmitter and receiver
625  DF  .~.~.~.~.~> Having plural sonic type transmitter or receiver transducers {1}

DEFINITION

Classification: 73/620

By reflected wave:

(under subclass 618) Subject matter wherein the wave transmitted to the test body is reflected from a surface within the test body and is received.