US PATENT SUBCLASS 702 / FOR 140
.~.~ Particle count, distribution, size (364/555)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 135  DF  .~ Measuring and evaluating (e.g., performance) (364/551.01) {5}
FOR 140.~.~ Particle count, distribution, size (364/555)

DEFINITION

Classification: 702/FOR.140

Particle count, distribution, size:

Foreign art collections including subject matter for the enumeration of particles and the evaluation of the properties of particles such as size, spatial dispersion, etc.