US PATENT SUBCLASS 702 / FOR 125
.~.~.~.~ Flaw or defect (364/507)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

*  DD  APPLICATIONS (364/400) {2}
FOR 115  DF  .~ Chemical and engineering sciences (364/496) {3}
FOR 123  DF  .~.~ Mechanical and civil engineering (364/505) {1}
FOR 124  DF  .~.~.~ Measuring or testing (364/506) {4}
FOR 125.~.~.~.~ Flaw or defect (364/507)

DEFINITION

Classification: 702/FOR.125

Flaw or defect:

Foreign art collections for determining the existence or amount of flaw or defect.