US PATENT SUBCLASS 702 / FOR 110
.~.~.~ Waveform (364/487)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

*  DD  APPLICATIONS (364/400) {1}
FOR 103  DF  .~ Electrical/electronic engineering (364/480) {1}
FOR 104  DF  .~.~ Measuring or testing (364/481) {5}
FOR 110.~.~.~ Waveform (364/487)

DEFINITION

Classification: 702/FOR.110

Waveform:

Foreign art collections wherein the area includes measuring and testing of or for a value or parameter of the shape of an electromagnetic wave.