US PATENT SUBCLASS 702 / 8-- .~.~.~ By radiation (e.g., nuclear, gamma, X-ray)

US PATENT SUBCLASS 702 / 8
.~.~.~ By radiation (e.g., nuclear, gamma, X-ray)

Current as of: June, 1999
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702 /	HD	DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1	DF	MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
2	DF	.~ Earth science {4}
6	DF	.~.~ Well logging or borehole study {5}
8		.~.~.~ By radiation (e.g., nuclear, gamma, X-ray)

DEFINITION

Classification: 702/8

By radiation (e.g., nuclear, gamma, X-ray):

(under subclass 6) Subject matter comprising (a) means for irradiating the earth formation with rays containing radiation particles (i.e., alpha, beta, gamma, neutrons, photon, etc.) such as those in nuclear, gamma, X-ray, etc. and (b) means for detecting and processing resultant signals for logging measurements.

SEE OR SEARCH THIS CLASS, SUBCLASS:

28, for molecular structure or composition determination using radiant energy.

40, for flaw or defect detection using radiant energy.

49, for flow metering using radiant energy.

134+, for a temperature measuring system using radiant energy.

172, for a thickness or width measurement system using radiant energy.

SEE OR SEARCH CLASS 250, Radiant Energy, appropriate subclasses.

324, Electricity: Measuring and Testing,

332+, and 344+ for measuring and testing of geophysical surface or subsurface with radiant energy or non-conductive type transmitter and receiver, respectively.